BeamPeek – Full Beam Analysis system under 3 seconds

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Ophir is happy to announce the release of the new BeamPeek.

The BeamPeek™ system allows simultaneous beam profiling, focal spot size and position, and power measurement of Additive Manufacturing (AM) lasers. It tracks how those parameters change with time to assist in the maintenance of quality and repeatability of the manufactured parts. The BeamPeek™ integrates a laser beam profiler camera, power meter, beam dump, beam splitters, and optics to provide an all inclusive solution for additive manufacturing laser analysis in an industrial environment.

  • Focal spot size
  • Focal spot position calibrated to build plane
  • Laser power
  • Laser power density
  • Changes in spot size & power over time

You can find more information here